SRINIVASA RAO GONDI. Multi-Modal AI-Driven Electrical and Optical Characterization Framework for Sub-5 nm Semiconductor Defect Localization. Research Briefs on Information and Communication Technology Evolution , [S. l.], v. 11, p. 188–198, 2025. DOI: 10.64799/rebicte.v11i.223. Disponível em: https://rebicte.org/index.php/rebicte/article/view/223. Acesso em: 8 feb. 2026.